As technological advancements in semiconductor manufacturing approach the constraints of Moore’s law, enhancing the performance of current chips can be achieved through a deeper comprehension of their nanoscale physical, chemical, and electrical properties.
D8 Discover Family:
The D8 DISCOVER Family is the ultimate multi-purpose X-ray diffractometer platform offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, polycrystalline materials to epitaxial multi-layered thin films.