Crystaline Defect Inspection

As technological advancements in semiconductor manufacturing approach the constraints of Moore’s law, enhancing the performance of current chips can be achieved through a deeper comprehension of their nanoscale physical, chemical, and electrical properties.

D8 Discover Family:

The D8 DISCOVER Family is the ultimate multi-purpose X-ray diffractometer platform offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, polycrystalline materials to epitaxial multi-layered thin films.

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