At the core of cutting-edge 5G communication devices are RF devices. Bruker utilizes X-ray metrology, specifically XRD, to analyze epi films, material phases, and compositions essential in piezoelectric materials used for BAW/SAW filters.
D8 Discover Family:
The D8 DISCOVER Family is the ultimate multi-purpose X-ray diffractometer platform offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, polycrystalline materials to epitaxial multi-layered thin films.
D8 Advance Family:
The D8 ADVANCE Family is a fully extensible modular system addressing the analytical needs of powder, bulk and thin film samples, at ambient and non-ambient conditions.