Film & Thickness

Thin films and coatings are pivotal in driving technological progress, spanning from Nano devices to protective surface coatings in micrometers. Bruker aids research and development endeavors in both academia and industry by providing a comprehensive array of analytical solutions for the precise characterization of thin films and coatings.


X-Ray Diffraction (XRD) analyzers are widely used in AM process development to identify causes of dimensional instability like austenitic phase transformations in ferrous alloys and to identify sources of residual stress. Compressive surface stress indicates long lifespan and tensile surface stress can lead to premature part failure.

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